The CSIR NET Admit Card 2025 is an essential document for candidates appearing in the Council of Scientific and Industrial Research (CSIR) National Eligibility Test (NET). Conducted by the National Testing Agency (NTA), this exam determines eligibility for Junior Research Fellowships (JRF) and Assistant Professor roles in science disciplines.
The admit card is expected to be released on February 23, 2025, a few days before the exam, which is scheduled from February 28 to March 2, 2025. Candidates can download their admit cards from the official website, csirnet.nta.ac.in.
Key Dates for CSIR NET 2025
| Event | Date |
|---|---|
| Admit Card Release Date | February 23, 2025 |
| Exam Dates | February 28 to March 2, 2025 |
| City Intimation Slip Release | February 15–18, 2025 |
| Official Website | csirnet.nta.ac.in |
How to Download CSIR NET Admit Card 2025
Downloading the admit card is a straightforward process if you follow these steps:
- Visit the official website: csirnet.nta.ac.in.
- Look for the link labeled “CSIR NET Admit Card 2025” on the homepage.
- Click on the link and enter your login credentials:
- Application Number
- Date of Birth
- Security Pin
- After logging in, your admit card will appear on the screen.
- Verify all details and download the admit card.
- Print a hard copy for future use.
Details Mentioned on the Admit Card
Once you download your admit card, ensure that all details are accurate:
- Candidate’s Name
- Roll Number
- Application Number
- Exam Date and Time
- Examination Center Address
- Candidate’s Photograph and Signature
- Exam Day Guidelines
If there are any discrepancies in the information, contact NTA immediately to rectify them.
Documents to Carry Along with Admit Card
On exam day, ensure you bring the following items to avoid any issues:
- A printed copy of your CSIR NET Admit Card 2025.
- A valid photo ID proof (e.g., Aadhaar Card, Passport, Voter ID).
- Passport-sized photographs (same as uploaded during application).
Failure to carry these documents may result in disqualification from appearing in the exam.